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System-on-Chip Test: Methodology & Experiences - IEEE
WebBroadcom Limited. 2005 年 9 月 - 目前17 年 8 個月. Manager, Test Engineering in Broadcom (美商博通) : Job function : Support WiFi/ING projects board level test solution, data analysis and yield improvement. 1. Lead a team to support VDM/CDM projects (Wifi/BT/ING) from NPI to production, issues debugging/yield improvement. 2. WebJul 8, 2024 · The purpose of CP test is to screen out the bad chips before packaging, so as to save the cost of packaging.At the same time, the yield of Wafer can be more directly … free cleaning checklist download
Software-Driven and System-Level Tests Drive Chip Quality
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